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Publication - Dr Ian Lindsay

    On the sensitivity of Interferometric Cross-Polarisation Microscopy for nanoparticle detection in the near-infrared.

    Citation

    Miles, B, Robinson, E, van Dijk, E, Lindsay, I, van Hulst, NF & Gersen, H, 2015, ‘On the sensitivity of Interferometric Cross-Polarisation Microscopy for nanoparticle detection in the near-infrared.’. ACS Photonics, vol 2., pp. 1705-1711

    Abstract

    We address the sensitivity of Interferometric Cross-Polarisation Microscopy by comparing scattering and absorption by spherical 10nm nanoparticles through a combination of modelling and experiment. We show that orthogonality of light in the two polarisation branches of Cross-Polarisation Microscopy ensures that only light that has interacted with a nanoparticle is interferometrically enhanced. As a result background-free shot noise-limited detection is achieved for sub-μW optical powers at the sample. Our modelling in particular shows that in the near-infrared regime, above the plasmon resonance frequency of spherical nanoparticles, the cross-polarisation approach is several orders of magnitude more sensitive than conventional extinction based detection. This enhanced near-infrared sensitivity for spherical nanoparticles is promising for applications requiring low absorption and low power imaging of nanoparticles in cells.

    Full details in the University publications repository